EAN: 9783031797842

Bilder-Quelle: discount24.de - Sport-Freizeit

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits systems. The material covered in the book should be sufficient for a course or part of a course in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy fault coverage sensitization and backtracking. Chapter 3 introduces the key concepts of testability followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction Fault Detection in Logic Circuits Design for Testability Built-in Self-Test References

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