EAN: 9783731500254

Bilder-Quelle: discount24.de - Sport-Freizeit

In the last two decades the reliability of small electronic devices used in automotive or consumer electronics gained researchers attention. Thus there is the need to understand the fatigue properties and damage mechanisms of thin films. In this thesis a novel high-throughput testing method for thin films on Si substrate is presented. The specialty of this method is to test one sample at different strain amplitudes at the same time and measure an entire lifetime curve with only one experiment.

Produktinformationen zuletzt aktualisiert am
23.03.2025 um 10:47 Uhr

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