EAN: 9789811010729

Bilder-Quelle: shopping24.de – Sport

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions offering insights into reliability issues in digital design and their cross-layer countermeasures.

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04.04.2025 um 12:52 Uhr

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