9789811044328 - SpringerBriefs in Applied Sciences and Technology Field Emission Scanning Electron Microscopy - Nicolas Brodusch Hendrix Demers Raynald Gauvin Kartoniert (TB)

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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes scanning- transmission electron microscopes (SEM STEM) simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials metallurgy geology and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM -TEM) historically run at higher beam accelerating voltage

Produktinformationen zuletzt aktualisiert am
26.03.2025 um 17:41 Uhr

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EAN

9789811044328

MPN

ASIN

9811044325

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